ATPG targets faults at IC-gate boundaries, but 50% of defects are located within cells. Learn how cell-aware ATPG and user-defined fault models help to ferret out these hard-to-squash bugs.
Download this article in PDF format. The complexity of automotive integrated circuits (ICs) has grown exponentially with the introduction of advanced driver-assistance systems and autonomous drive ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results
Feedback