With the inventions of transmission electron microscopy (TEM) in 1931 and scanning electron microscopy (SEM) shortly after in 1937, scientists gained an unprecedented ultrastructural view of the ...

In the world of nanotechnology, where structures are measured in billionths of a meter, precise imaging and measurement techniques are essential. Critical Dimension Scanning Electron Microscopy ...

Definition:4D Scanning Transmission Electron Microscopy (4D-STEM) is an advanced imaging technique that combines high-resolution electron microscopy with diffraction pattern analysis over a ...

Since the first transmission electron microscope was sold in 1935, microscopes that use electrons--rather than light waves--to image objects have brought into focus levels of detail that were ...

Scanning transmission electron microscopy, or STEM, is a powerful imaging technique that enables researchers to study a material’s morphology, composition, and bonding behavior at the angstrom scale.

Microscope images could be obtained much more quickly -- rather than one pixel at a time -- thanks to a new imaging method for neutral atomic beam microscopes. It could ultimately lead to engineers ...

The exact birth of the scanning microscope principle is not clear, as the work of numerous scientists contributed to its inception. However, it is generally accepted that the first scanning microscope ...

A close-up of the magnetic encoding device before it was attached. The atomic beam enters the device through the hollow white ceramic tube shown. Microscope images could be obtained much more quickly ...