Add Yahoo as a preferred source to see more of our stories on Google. Scientists from the federally funded Argonne National Laboratory in Illinois and the University of Virginia have developed a new ...

Researchers from Northwestern University, University of Virginia, Carnegie Mellon University, and Argonne National Laboratory have made a significant advancement in defect detection and process ...

Longitudinal (top) and axial (middle) images of X-Ray CT data of parts with 6 internal defects: a spherical clog, a stellated shaped clog, a cone shaped void, a blob shaped void, an elliptical warp of ...

New research offers an enhanced understanding of common defects in transition-metal dichalcogenides (TMDs) -- a potential replacement for silicon in computer chips -- and lays the foundation for ...

Whether the discussion is about smart manufacturing or digital transformation, one of the biggest conversations in the semiconductor industry today centers on the tremendous amount of data fabs ...