ATPG targets faults at IC-gate boundaries, but 50% of defects are located within cells. Learn how cell-aware ATPG and user-defined fault models help to ferret out these hard-to-squash bugs.

This is the second part of a two-part discussion (Part 1 appeared in August) in which the author considers fault-coverage analysis and simulation for full-scan testing of ASIC designs. These elements ...

Carbon capture and storage (CCS) project sanctioning requires reasonable estimates of CO 2 storage volume and plume migration in the reservoir. Numerical simulation based on geological data provides ...

As semiconductor applications in automotive, data center, and high-performance computing grow increasingly mission-critical, the industry faces mounting pressure to achieve near-perfect manufacturing ...

A newly drafted IEEE standard will bring more consistency to defect metrics in analog/mixed (AMS) designs, a long-overdue step that has become too difficult to ignore in the costly heterogeneous ...

Organizations are looking to artificial intelligence to bolster how they do simulations, leading to faster innovation and ultimately better products. In association withSiemens Digital Industries ...

Before a potential customer buys an autonomous mobile robot solution, Locus Robotics often uses different types of simulation to determine the type of robots needed and the number needed to optimize ...