ATPG targets faults at IC-gate boundaries, but 50% of defects are located within cells. Learn how cell-aware ATPG and user-defined fault models help to ferret out these hard-to-squash bugs.

This is the second part of a two-part discussion (Part 1 appeared in August) in which the author considers fault-coverage analysis and simulation for full-scan testing of ASIC designs. These elements ...

Carbon capture and storage (CCS) project sanctioning requires reasonable estimates of CO 2 storage volume and plume migration in the reservoir. Numerical simulation based on geological data provides ...

As semiconductor applications in automotive, data center, and high-performance computing grow increasingly mission-critical, the industry faces mounting pressure to achieve near-perfect manufacturing ...

Organizations are looking to artificial intelligence to bolster how they do simulations, leading to faster innovation and ultimately better products. In association withSiemens Digital Industries ...