Abstract: As the feature size of dynamic random access memories (DRAM) continues to scale down, the shrunk storage capacitors have met essential challenges, namely, the insufficient capacitances and ...
Abstract: To satisfy the demand of high-speed and low-power non-volatile memory in the field of integrated circuits for in-memory computing, HfO2-based ferroelectric tunnel junctions have been ...
Chemical Engineering Department, College of Engineering, King Saud University, P.O. Box 800, Riyadh 11421, Saudi Arabia ...
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